Modeling of haptic sensing of nanolithography with an atomic force microscope

Proceedings - IEEE International Conference on Robotics and Automation

Volumn 2005, Issue , 2005, Pages 2446-2451

  Fok, L M ^a   Liu, Y H ^a   Li, Wen J ^a  

^a CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Atomic force microscope; Haptic interface; Nanomanipulation; Virtual reality

Indexed keywords

HAPTIC FEEDBACK; INTERMOLECULAR FORCES; NANOMANIPULATION;

ATOMIC FORCE MICROSCOPY; FEEDBACK; NANOTECHNOLOGY; TOPOLOGY; VIRTUAL REALITY;

HAPTIC INTERFACES;

EID: 33846121603     PISSN: 10504729     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ROBOT.2005.1570479     Document Type: Conference Paper

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