Electronic switching of single silicon atoms by molecular field effects

Journal of the American Chemical Society

Volumn 128, Issue 51, 2006, Pages 16791-16797

  Harikumar, Krishnan R ^a   Polanyi, John C ^a   Sloan, Peter A ^a   Ayissi, Serge ^a   Hofer, Werner A ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC SWITCHING; MOLECULAR CONFIGURATION; MOLECULAR FIELD EFFECTS; SELF ASSEMBLED CHLORODODECANE MOLECULES;

ELECTRIC CURRENT DISTRIBUTION; OSCILLATIONS; PARAFFINS; SCANNING TUNNELING MICROSCOPY; SELF ASSEMBLY; SWITCHING THEORY;

SILICON;

CHLORODODECANE; DODECANE; SILICON; UNCLASSIFIED DRUG;

ARTICLE; CONFORMATION; ELECTRONICS; MOLECULAR BIOLOGY; MOLECULAR MODEL; OSCILLATION; SCANNING TUNNELING MICROSCOPY; SURFACE PROPERTY; THERMAL ANALYSIS;

EID: 33845943488     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja062874c     Document Type: Article

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32. Because of their negligible switching amplitude, time traces taken far removed from the center of the switching effect often lead to numerical instabilities in the auto-correlation analysis. We imposed the following acceptance criteria to remove unreliable data from the switching maps of Figure 3A.B: for the faulted corral only time traces with an "on" lifetime less than 1400 ms and an "off" lifetime greater than 330 ms were included, and for the unfaulted corral only time traces with an "on" lifetime less than 330 ms and an "off" lifetime less than 550 ms were included.
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