MOSFET modeling beyond 100nm technology: Challenges and perspectives

International Conference on Simulation of Semiconductor Processes and Devices, SISPAD

Volumn 2005, Issue , 2005, Pages 1-6

  Miura Mattausch, Mitiko ^a  

^a HIROSHIMA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; INTEGRATED CIRCUIT LAYOUT; MATHEMATICAL MODELS; PROBLEM SOLVING;

CIRCUIT SIMULATION; COMPACT MODELS; MODEL PARAMETERS;

MOSFET DEVICES;

EID: 33845906343     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/sispad.2005.201459     Document Type: Conference Paper

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