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Volumn 16, Issue 12, 2006, Pages 681-683

Effective suppression of IV knee walk-out in AlGaN/GaN HEMTs for pulsed-IV pulsed-RF with a large signal network analyzer

Author keywords

GaN; High electron mobility transistor (HEMT); Large signal network analyzer (LSNA); Load line; Traps

Indexed keywords

LARGE SIGNAL NETWORK ANALYZER (LSNA); LOAD LINES; ON-WAFER DEVICES; TRAPS;

EID: 33845517635     PISSN: 15311309     EISSN: None     Source Type: Journal    
DOI: 10.1109/LMWC.2006.885632     Document Type: Article
Times cited : (31)

References (8)
  • 3
    • 0000220552 scopus 로고    scopus 로고
    • Trapping effects in GaN and SiC microwave FETs
    • Jun.
    • S. C. Binari, P. B. Klein, and T. E. Kazior, "Trapping effects in GaN and SiC microwave FETs," Proc. IEEE, vol. 90, no. 6, pp. 1048-1058, Jun. 2002.
    • (2002) Proc. IEEE , vol.90 , Issue.6 , pp. 1048-1058
    • Binari, S.C.1    Klein, P.B.2    Kazior, T.E.3
  • 4
    • 0035278804 scopus 로고    scopus 로고
    • The impact of surface states on the DC and RF characteristics of AlGaN/GaN HFETs
    • Mar.
    • R. Vetury, N. Q. Zhang, S. Keller, and U. K. Mishra, "The impact of surface states on the DC and RF characteristics of AlGaN/GaN HFETs," IEEE Trans. Electron Devices, vol. 48, no. 3, pp. 560-566, Mar. 2001.
    • (2001) IEEE Trans. Electron Devices , vol.48 , Issue.3 , pp. 560-566
    • Vetury, R.1    Zhang, N.Q.2    Keller, S.3    Mishra, U.K.4
  • 8
    • 33745227386 scopus 로고    scopus 로고
    • Pulsed-IV pulsed-RF measurements using a large signal network analyzer
    • Long Beach, CA, Jun., [CD ROM]
    • S. J. Doo, P. Roblin, S. Lee, D. Chaillot, and M. V. Bossche, "Pulsed-IV pulsed-RF measurements using a large signal network analyzer," in ARFTG 65th Conf. Dig., Long Beach, CA, Jun. 2005, [CD ROM].
    • (2005) ARFTG 65th Conf. Dig.
    • Doo, S.J.1    Roblin, P.2    Lee, S.3    Chaillot, D.4    Bossche, M.V.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.