Pulsed-IV pulsed-RF measurements using a large signal network analyzer

65th ARFTG Microwave Measurements Conference Digest 2005

Volumn , Issue , 2005, Pages 63-69

  Doo, Seok Joo ^a   Roblin, Patrick ^a   Lee, Sunyoung ^a   Chaillot, Dominique ^a,b   Bossche, Marc Vanden ^b  

^a OHIO STATE UNIVERSITY   (United States)

^b DIF   (France)

Author keywords

Desensitization; Large signal network analyzer (LSNA); Pulsed measurement

Indexed keywords

DESENSITIZATION; LARGE SIGNAL NETWORK ANALYZER (LSNA); LEAST-SQUARE FITTING; PULSED MEASUREMENT;

CURRENT VOLTAGE CHARACTERISTICS; LEAST SQUARES APPROXIMATIONS; SCATTERING PARAMETERS; SPECTRUM ANALYSIS; TIME DOMAIN ANALYSIS; TRANSISTORS;

ELECTRIC NETWORK ANALYZERS;

EID: 33745227386     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTGS.2005.1500570     Document Type: Conference Paper

References (7)

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3. J. Scott, J. G. Rathmell, and A. Parker. "Pulsed device measurements and applications," IEEE Transactions on Microwave Theory and Techniques, Vol. 44, pp. 2718-2723, Dec. 1996.
4. P. Vael, Y. Rolain, C. Gaquiere and H. Gerard, "Calibrated linear and nonlinear pulsed RF measurements on an amplifier," 2001 MIT Digest, pp. 2187-2190, 2001.
5. S.K. Myoung, X. cui, D. Chaillot, P. Roblin, R. Verbeyst. M.V. Bossche, S. J. Doo, and W. Dai, "Large signal network analyzer with trigger for baseband & RF system characterization with application to K-modeling & output baseband modulation linearization," ARFTG 64 Conference Digest, Orlando, Dec. 2004
6. Large-Signal Newark Analyzer System Manual, NMDG Engineering, 2004
7. J.-P. Teyssier, S. Augaudy, D. Barataud, J-M Nébus, R. Quéré, "Large-signal time domain characterization of microwave transistors under RF pulsed conditions, " 57th ARFTG, Phoenix, Arizona, May 2001.