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Volumn 91, Issue 5, 2002, Pages 2951-2958

Influence of segregation on the measurement of stress in thin films

Author keywords

[No Author keywords available]

Indexed keywords


EID: 33845458897     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1447327     Document Type: Article
Times cited : (10)

References (37)
  • 13
    • 33845405120 scopus 로고    scopus 로고
    • note
    • Depending on the experimental technique used, the measured in-plane lattice parameter may be an average over the thickness of the film (XRD) or a surface lattice parameter (RHEED).
  • 25
    • 33845415998 scopus 로고    scopus 로고
    • note
    • 2(z)dz.
  • 28
    • 0003533533 scopus 로고
    • edited by R. Gomer and C. S. Smith (University Chicago Press, Chicago)
    • C. Herring, in Structure and Properties of Crystal Surfaces, edited by R. Gomer and C. S. Smith (University Chicago Press, Chicago, 1953).
    • (1953) Structure and Properties of Crystal Surfaces
    • Herring, C.1
  • 32
    • 33845455412 scopus 로고    scopus 로고
    • note
    • Owing to the smaller value of the surface energy of A (compared to the surface energy of B), equilibrium surface segregation only occurs in the second case.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.