Enhanced field emission properties of thin-multiwalled carbon nanotubes: Role of SiOx coating

Journal of Applied Physics

Volumn 100, Issue 10, 2006, Pages

  Moon, J S ^a   Alegaonkar, P S ^a   Han, J H ^a   Lee, T Y ^a   Yoo, J B ^a   Kim, J M ^b  

^a Sungkyunkwan University   (South Korea)

^b Samsung SDI   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON EMISSION; FIELD EMISSION MICROSCOPES; FOURIER TRANSFORM INFRARED SPECTROSCOPY; HIGH RESOLUTION ELECTRON MICROSCOPY; SILICA; THERMOGRAVIMETRIC ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

ACID TREATMENTS; FIELD EMISSION PROPERTIES; HIGH-TEMPERATURE OXIDATION; THIN-MULTIWALLED CARBON NANOTUBES (T-MWNT);

CARBON NANOTUBES;

EID: 33845202506     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2384795     Document Type: Article

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