Environmental Scanning Electron Microscope study of SiO2 heterogeneous material with helium and water vapor

Vacuum

Volumn 81, Issue 5, 2007, Pages 599-603

  Khouchaf, L ^a   Boinski, F ^a  

^a ECOLE DES MINES DE DOUAI   (France)

Author keywords

Beam skirt; ESEM; SiO2

Indexed keywords

ELECTRON BEAMS; ELECTRON SCATTERING; HELIUM; SCANNING ELECTRON MICROSCOPY;

BEAM SKIRT; WATER VAPOR;

SILICA;

EID: 33845186460     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2006.08.001     Document Type: Article

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