SCOPUS 정보 검색 플랫폼

Volumn 19, Issue 2, 1997, Pages 85-91

The effect of some instrument operating conditions on the x-ray microanalysis of particles in the environmental scanning electron microscope

(1) Carlton, Robert A a

a SANOFI (France)

Author keywords

Beam broadening; Energy dispersive x ray spectroscopy; Environmental scanning electron microscopy; X ray microanalysis

Indexed keywords

ARTICLE; ELECTRIC CONDUCTIVITY; ELECTRIC POTENTIAL; ELECTRON BEAM; ELECTRON RADIATION; ENVIRONMENTAL MONITORING; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; X RAY MICROANALYSIS;

EID: 0031396482 PISSN: 01610457 EISSN: None Source Type: Journal
DOI: 10.1002/sca.4950190205 Document Type: Article

Times cited : (12)

References (8)

1
- 0001906907
- X-ray microanalysis in the ESEM
- Bolon RB : X-ray microanalysis in the ESEM. Microbeam Anal 199-200 (1991)
- (1991) Microbeam Anal , pp. 199-200
- Bolon, R.B.¹

2
- 33947711876
- Foundations of environmental scanning electron microscopy
- Danilatos GD: Foundations of environmental scanning electron microscopy. Ad Electronics Electron Phys 71,109-250(1988)
- (1988) Ad Electronics Electron Phys , vol.71 , pp. 109-250
- Danilatos, G.D.¹

3
- 0012708531
- Empirical evaluation of the electron skirt in the environmental SEM: Implications for energy dispersive x-ray analysis
- Doehne E, Bower NW: Empirical evaluation of the electron skirt in the environmental SEM: Implications for energy dispersive x-ray analysis. Microbeam Anal 2, S35-36 (1993a)
- (1993) Microbeam Anal , vol.2
- Doehne, E.¹ Bower, N.W.²

4
- 7144221276
- Experimental conditions for semi-quantitative SEM/EDS of painting cross sections using the environmental scanning electron microscope
- Doehne E. Bower NW: Experimental conditions for semi-quantitative SEM/EDS of painting cross sections using the environmental scanning electron microscope. Microbeam Anal 2, S39-40 (1993b)
- (1993) Microbeam Anal , vol.2
- Doehne, E.¹ Bower, N.W.²

5
- 0003539132
- Plenum Press, New York
- Goldstein JI, Newbury DE, Echlin P, Joy DC, Romig AD, Lyman CE, Fiori C, Lifshin E: Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists (2nd ed.) Plenum Press, New York (1992)
- (1992) Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists (2nd Ed.)
- Goldstein, J.I.¹ Newbury, D.E.² Echlin, P.³ Joy, D.C.⁴ Romig, A.D.⁵ Lyman, C.E.⁶ Fiori, C.⁷ Lifshin, E.⁸

6
- 0002730578
- Effects of chamber pressure and accelerating voltage of x-ray resolution in the ESEM
- (Eds. Bailey GW. Bentley J, Small JA), San Francisco Press, San Francisco
- Griffin BJ: Effects of chamber pressure and accelerating voltage of x-ray resolution in the ESEM. Proc 50th Annual Meeting EMSA (Eds. Bailey GW. Bentley J, Small JA), San Francisco Press, San Francisco (1992) 1324-1325
- (1992) Proc 50th Annual Meeting EMSA , pp. 1324-1325
- Griffin, B.J.¹

7
- 0003313809
- X-ray resolution at low chamber pressures and chamber gas fluorescence in the Electroscan ESEM
- Griffin BJ, Trautman RL, Coffey JC: X-ray resolution at low chamber pressures and chamber gas fluorescence in the Electroscan ESEM. Microbeam Anal 2, S37-38 (1993)
- (1993) Microbeam Anal , vol.2
- Griffin, B.J.¹ Trautman, R.L.² Coffey, J.C.³

8
- 0029098934
- X-ray microanalysis of wet biological specimens in the environmental scanning electron microscope. 1. Reduction of specimen distance under different atmospheric conditions
- Griffin BJ, Sigee DC: X-ray microanalysis of wet biological specimens in the environmental scanning electron microscope. 1. Reduction of specimen distance under different atmospheric conditions. J Microsc 179, pt 1, 22-28 (1995)
- (1995) J Microsc , vol.179 , Issue.1 PART , pp. 22-28
- Griffin, B.J.¹ Sigee, D.C.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.