Analysis of atomic force microscopy data for deformable materials

Journal of Adhesion Science and Technology

Volumn 18, Issue 10, 2004, Pages 1199-1215

  Rutland, Mark W ^a,b,c   Tyrrell, James W G ^a   Attard, Phil ^a  

^a UNIVERSITY OF SYDNEY   (Australia)

^b ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

^c INSTITUTE FOR SURFACE CHEMISTRY   (Sweden)

Author keywords

Atomic force microscopy; Cellulose; Deformable materials; Piezo calibration; Polystyrene

Indexed keywords

DEFORMABLE MATERIALS; DYNAMIC VISCOELASTIC MEASUREMENTS; PIEZO-CALIBRATION; RIGID SURFACES; AFM; ATOMIC FORCE MICROSCOPES; DEFORMABLE MATERIAL; DEFORMABLE PARTICLES; END POINTS; EXPANSION FACTORS; FORCE CURVE; GLASSY STATE; PIEZO-DRIVE; POLYMERIC SUBSTRATE; POLYSTYRENE FILMS; RIGID SUBSTRATES; VELOCITY DEPENDENCE; VISCOELASTIC MEASUREMENTS; YOUNG'S MODULUS;

ADHESION; CALIBRATION; CELLULOSE; DEFORMATION; ELASTIC MODULI; PHOTODIODES; PIEZOELECTRIC DEVICES; POLYSTYRENES; VELOCITY; VISCOELASTICITY; ATOMIC FORCE MICROSCOPY; SUBSTRATES;

ATOMIC FORCE MICROSCOPY; DEFORMATION;

EID: 4444319317     PISSN: 01694243     EISSN: None     Source Type: Journal    
DOI: 10.1163/1568561041581324     Document Type: Article

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