The microstructure of SiO thin films: From nanoclusters to nanocrystals

Philosophical Magazine

Volumn 87, Issue 1, 2007, Pages 11-27

  Wang, J ^a   Wang, X F ^a   Li, Q ^a   Hryciw, A ^b   Meldrum, A ^b  

^a CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

^b UNIVERSITY OF ALBERTA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; ANNEALING; CRYSTALLIZATION; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONIC STRUCTURE; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; OSCILLATORS (ELECTRONIC); SILICON COMPOUNDS; THERMAL EFFECTS; TRANSMISSION ELECTRON MICROSCOPY;

CRITICAL TEMPERATURE; INTERFACE PLASMON; PHASE DECOMPOSITION; VALENCE ELECTRON ENERGY LOSS SPECTRUM;

THIN FILMS;

EID: 33751536517     PISSN: 14786435     EISSN: 14786443     Source Type: Journal    
DOI: 10.1080/14786430600863047     Document Type: Article

References (57)

1. K.D. Hirschman, L. Tsybeskov, S.P. Duttagupta, et al., Nature 384 338 (1996).
2. P. Pellegrino, B. Garrido, C. Garcia, et al., J. Appl. Phys. 97 074312 (2005).
3. A. Thean and J.P. Leburton, J. Appl. Phys. 90 6384 (2001).
4. A. Hryciw, J. Laforge, C. Blois, et al., Adv. Mater. 17 845 (2005).
5. A. Meldrum, Rec. Res. Dev. Nucl. Phys. 1 93 (2004).
6. A. Meldrum, A. Hryciw, A. MacDonald, et al., J. Vac. Sci. Technol. A 24 713 (2006).
7. M. Glover and A. Meldrum, Opt. Mater. 27 977 (2005).
8. J.Y. Jeong, S. Im, M.S. Oh, et al., J. Lumin. 80 285 (1999).
9. Y.-C. Fang, L.-Y. Li, Y.-Y. Zhao, et al., Chin. Phys. Lett. 20 2042 (2003).
10. D. Neshiva, I. Bineva, Z. Levi, et al., Vacuum 68 1 (2003).
11. M. Molinari, H. Rinnert and M. Vergnat, Appl. Phys. Lett. 82 3877 (2003).
12. H. Rinnert, M. Vergnat and A. Burneau, J. Appl. Phys. 89 237 (2001).
13. F. Iacona, C. Bongiorno, C. Spinella, et al., J. Appl. Phys. 95 3723 (2004).
14. C.Y. Chen, W.D. Chen, S.F. Song, et al., Physica E 27 21 (2005).
15. A. Janotta, M. Schmidt, R. Janssen, et al., J. Non-crystalline Solids 299 688 (2002).
16. A. Hryciw, C. Blois, A. Meldrum, et al., Opt. Mater. 28 874 (2006).
17. H.R. Philip, J. phys. Chem. Solids 32 1935 (1971).
18. G.W. Brady, J. phys. Chem. 63 1119 (1959).
19. M. Nagamori, J-A. Boivin, A. Claveau, J. Non-crystalline Solids 189 270 (1995)
20. (see also B. Friede and M. Jensen, J. Non-crystalline Solids 204 202 (1996)).
21. V. Belot, R.P. Corriu, D. Leclerq, et al., J. Non-crystalline Solids 127 207 (1991).
22. A. Hohl, T. Weider, P.A. van Aken, et al., J. Non-crystalline Solids 320 255 (2003).
23. K. Schulmeister and W. Mader, J. Non-crystalline Solids 320 143 (2003).
24. F. Rochet, G. Dufour, H. Roulet, et al., Phys. Rev. B 37 6468 (1988).
25. A. Harstein, J.C. Tsang, D.J. DiMaria, et al., Appl. Phys. Lett. 36 836 (1980).
26. R.F. Egerton, Electron Energy Loss Spectroscopy in the Electron Microscope (Plenum Press, New York, 1986).
27. M. Molinari, H. Rinnert and M. Vergnat, Europhys. Lett. 66 674 (2004).
28. L.X. Yi, J. Heitmann, R. Scholz, et al., Appl. Phys. Lett. 81 4248 (2002).
29. V. Ioannou-Sougleridis and A.G. Nassiopoulou, A. Travlos, Nanotechnology 14 1174 (2003).
30. J.U. Schmidt and B. Schmidt, Mater. Sci. Engng B 101 28 (2003).
31. U. Kreibig and M. Vollmer, Optical Properties of Metal Clusters (Springer, New York, 1995).
32. R.J. Temkin, J. non-crystalline Solids 215 17 (1975).
33. See, for example, H.W. Choi, H.J. Woo, J.K. Kim, et al., Bull. Korean Chem. Soc. 25 525 (2004).
34. L.A.J. Garvie and P.R. Buseck, Am. Miner. 84 946 (1999).
35. L.A.J. Garvie and R. Brydson, Am. Miner. 79 411 (1994).
36. E. Martinez and F. Ynduráin, Phys. Rev. B 24 5718 (1981).
37. J. Keranen, T. Lepisto, L. Ryen, et al., J. Appl. Phys. 84 6827 (1998).
38. J. Wong, D.A. Jefferson, T.G. Sparrow, et al., Appl. Phys. Lett. 48 65 (1986).
39. L.A.J. Garvie, P. Rez, J.R. Alvarez, et al., Solid St. Commun. 106 303 (1998).
40. L.A.J. Garvie, P. Rez, J.R. Alvarez, et al., Am. Miner. 85 732 (2000).
41. R. Carius, R. Fischer, E. Holzenkampfer, et al., J. Appl. Phys. 52 4241 (1981).
42. I. Umezu, K. Miyamoto, N. Sakamoto, et al., Jap. J. Appl. Phys. 34 1753 (1995).
43. C. Tarrio and S.E. Schnatterly, J. Opt. Soc. Am. B 10 952 (1993).
44. W.Y. Ching, Phys. Rev. B 26 6633 (1982).
45. B.W. Reed, J.M. Chen, N.C. MacDonald, et al., Phys. Rev. B 60 5641 (1999).
46. N.F. Mott, Phil. Mag. B 43 941 (1981).
47. Y. Kanzawa, T. Kageyama, S. Takeoka, et al., Solid St. Commun. 102 533 (1997).
48. P. Moreau, N. Brun, C.A. Walsh, et al., Phys. Rev B 56 6774 (1997).
49. M.C. Cheynet and T. Epicier, Phil. Mag. 84 1753 (2004).
50. H. Fukuda, M. Yasuda and T. Iwabuchi, Appl. Phys. Lett. 61 693 (1992).
51. M.J. Estes and G. Moddel, Phys. Rev. B 54 14633 (1996).
52. T. Muller, K.H. Heinig and W. Moller, Appl. Phys. Lett. 81 3049 (2002).
53. L.A. Nesbitt, Appl. Phys. Lett. 46 38 (1985).
54. D. Tsoukalas, G. Tsamis and P. Normand, J. Appl. Phys. 89 7809 (2001).
55. O. Jaoul, F. Bejina, F. Elie, et al., Phys. Rev. Lett. 74 2038 (1995).
56. M. Zacharias and P. Stretenberger, Phys. Rev. B 62 8391 (2000).
57. S. Veprek, Z. Iqbal and F.A. Sarott, Phil. Mag. B 45 137 (1982).