Enhancement of topographic images obtained in liquid media by atomic force microscopy

Journal of Physical Chemistry B

Volumn 110, Issue 41, 2006, Pages 20526-20532

  Kim, Younghun ^a   Yi, Jongheop ^b  

^a Kwangwoon University   (South Korea)

^b Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33751296367     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp063591+     Document Type: Article

References (20)

1. Choi, I.; Kang, S. K.; Lee, J.; Kim, Y.; Yi, J. Biomaterials 2006, 27, 4655-4660.
2. Kasas, S.; Wang, X.; Hirling, H.; Catsicas, S.; Haeberii, C.; Dietler, G.; Thomson, N. Rev. Sci. Instrum. 2000, 71, 4338-4340.
3. Zhang, H.; Zhang, D.; He, Y. Microsc. Res. Tech. 2005, 66, 126-131.
4. Menchaca, J.-L.; Jachimska, B.; Cuisinier, F.; Pérez, E. Colloids Surf. A 2003, 222, 185-194.
5. Kim, Y.; Kang, S. K.; Choi, I.; Lee, J.; Yi, J. J. Am. Chem. Soc. 2005, 127, 9380-9381.
6. Tello, M.; García, R. Appl. Phys. Lett. 2003, 83, 2339-2341.
7. Arai, T.; Aoki, D.; Okabe, Y.; Fujihira, M. Thin Solid Films 1996, 273, 322-326.
8. Kinser, C. R.; Schmitz, M. J.; Hersam, M. C., Nano Lett. 2005, 5, 91-95.
9. Kim, Y.; Kang, S. K.; Choi, I.; Lee, J.; Yi, J. Appl. Phys. Lett. 2006, 88, 173121-1-173121-3.
10. Kim, Y.; Choi, I.; Kang, S. K.; Lee, J.; Yi, J. Rev. Sci. Instrum. 2006, 77, 036114-1-036114-3.
11. Mou, J.; Huang, G.; Shao, Z. Rev. Sci. Instrum. 1996, 67, 2654-2655.
12. Jones, R. E.; Hart, D. P. Tribol. Int. 2005, 38, 335-361.
13. Hurley, C. R.; Leggett, G. J. Langmuir 2006, 22, 4179-4183.
14. Transport Phenomena; Bird, R. B., Stewart, W. E., Lightfoot, E. N., Eds.; Wiley: New York, 1960.
15. Analysis of Transport Phenomena; Deen, W. M., Ed.; Oxford University Press: New York, 1998.
16. Carpick, R. W.; Ogletree, D. F.; Salmeron, M. J. Colloid Interface Sci. 1999, 211, 395-400.
17. Kwon, J.; Honh, J.; Kim, Y.-S.; Lee, D.-Y.; Lee, S.; Park, S. Rev. Sci. Instrum. 2003, 74, 4378-4383.
18. Kim, Y.; Choi, I.; Kang, S. K.; Lee, J.; Yi, J. Microelectron. Eng. 2005, 81, 341-348.
19. Kim, Y.; Choi, I.; Kang, S. K.; Lee, J.; Yi, J. Appl. Phys. Lett. 2005, 86, 073113-1-073113-3.
20. Kim, Y.; Choi, I.; Kang, S. K.; Lee, J.; Yi, J. Appl. Phys. Lett. 2006, 88, 013113_1-013113_3.