Fabrication of submicron size electrode via nonetching method for metal ion detection

Applied Physics Letters

Volumn 86, Issue 7, 2005, Pages 1-3

  Kim, Younghun ^a   Choi, Inhee ^a   Kang, Sung Koo ^a   Lee, Jeongjin ^a   Yi, Jongheop ^a  

^a Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEPOSITION; ELECTRIC CONDUCTIVITY; ETCHING; IONS; LITHOGRAPHY; MICROELECTRODES; PARTICLE DETECTORS; POLARIZATION; SELF ASSEMBLY;

METAL ION DETECTION; NANOPARTICLES; SELF POLARIZATION; SUBMICRON ELETRODES;

NANOTECHNOLOGY;

EID: 17044411332     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1866633     Document Type: Article

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