Dependence of image distortion in a liquid-cell atomic force microscope on fluidic properties

Applied Physics Letters

Volumn 88, Issue 17, 2006, Pages

  Kim, Younghun ^a   Kang, Sung Koo ^b   Choi, Inhee ^b   Lee, Jeongjin ^b   Yi, Jongheop ^b  

^a Kwangwoon University   (South Korea)

^b Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CANTILEVER BEAMS; FORCE MEASUREMENT; IMAGE SENSORS; KINEMATICS; SCANNING; VISCOSITY;

IMAGE DISTORTION; KINEMATIC VISCOSITY; STANDARD GRATING SAMPLE;

FLUIDS;

EID: 33646419577     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2196468     Document Type: Article

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