Positron annihilation induced Auger and gamma spectroscopies of surfaces

Radiation Physics and Chemistry

Volumn 76, Issue 2, 2007, Pages 285-290

  Weiss, A H ^a   Fazleev, N G ^a   Nadesalingam, M P ^a   Mukherjee, S ^a   Xie, S ^a   Zhu, J ^a   Davis, B R ^a  

^a UNIVERSITY OF TEXAS AT ARLINGTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; ELECTRON TRAPS; GAMMA RAY SPECTROMETERS; POSITRONS;

AUGER-GAMMA COINCIDENCE SPECTROSCOPY (AGCS); GAMMA-GAMMA COINCIDENCE SPECTROSCOPY; POSITRON ANNIHILATION-INDUCED AUGER ELECTRON SPECTROSCOPY (PAES);

POSITRON ANNIHILATION SPECTROSCOPY;

ARTICLE; AUGER ELECTRON SPECTROSCOPY; ELECTRON; GAMMA RADIATION; GAMMA SPECTROMETRY; LOW ENERGY RADIATION; MATHEMATICAL ANALYSIS; POSITRON; POSITRON ANNIHILATION INDUCED AUGER ELECTRON SPECTROSCOPY; SOLID; SURFACE PROPERTY;

EID: 33751175646     PISSN: 0969806X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.radphyschem.2006.03.053     Document Type: Article

References (17)

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