Study of the growth and stability of ultra-thin films of Au deposited on Si(1 0 0) and Si(1 1 1)

Surface Science

Volumn 475, Issue 1-3, 2001, Pages 37-46

  Kim, J H ^a   Yang, G ^a   Yang, S ^a   Weiss, A H ^a  

^a UNIVERSITY OF TEXAS AT ARLINGTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; DEPOSITION; FILM GROWTH; GOLD; INTERFACES (MATERIALS); SEMICONDUCTING SILICON; ULTRATHIN FILMS;

ELECTRON-INDUCED AUGER ELECTRON SPECTROSCOPY (EAES);

METALLIC FILMS;

EID: 0035277898     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)01059-1     Document Type: Article

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