Extension of inductive fault analysis to parametric faults in analog circuits with application to test generation

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1997, Pages 172-176

  Jaworski, Zbigniew ^a   Niewczas, Mariusz ^a   Kuzmicz, Wieslaw ^a  

^a WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT TESTING; STATISTICAL METHODS;

PARAMETRIC FAULT MODELING;

COMPUTER AIDED NETWORK ANALYSIS;

EID: 0030709162     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (27)