Classification of Defective Analog Integrated Circuits Using Artificial Neural Networks

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 20, Issue 1, 2004, Pages 25-37

  Stopjakova V ^a   Malosek P ^a   Micusik D ^b   Matej, M ^a   Margala, M ^c  

^a SLOVAK UNIVERSITY OF TECHNOLOGY   (Slovakia)

^b ST Microelectron Des Application   (Czech Republic)

^c University of Rochester   (United States)

Author keywords

Analog test; Artificial neural networks; Catastrophic faults; Supply current monitoring

Indexed keywords

BACKPROPAGATION; COMPUTER HARDWARE; COMPUTER SIMULATION; DEFECTS; ELECTRIC CURRENTS; LARGE SCALE SYSTEMS; MATHEMATICAL MODELS; MICROPROCESSOR CHIPS; NEURAL NETWORKS; OPTIMIZATION; VECTORS;

ANALOG INTEGRATED CIRCUITS; ANALOG TESTS; CATASTROPHIC FAULTS; NEURONS; SUPPLY CURRENT MONITORING;

CMOS INTEGRATED CIRCUITS;

EID: 10744229969     PISSN: 09238174     EISSN: None     Source Type: Journal    
DOI: 10.1023/B:JETT.0000009311.63472.d6     Document Type: Conference Paper

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