Specification-driven test generation for analog circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 19, Issue 10, 2000, Pages 1189-1201

  Variyam, Pramodchandran N ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; FAILURE ANALYSIS; LINEAR INTEGRATED CIRCUITS; LINEAR PROGRAMMING; NONLINEAR NETWORK ANALYSIS; PARAMETER ESTIMATION; STATE SPACE METHODS;

ANALOG CIRCUIT TESTING; ANALOG FAULT SIMULATION; FAULT SIMULATION ALGORITHM;

INTEGRATED CIRCUIT TESTING;

EID: 0034296832     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/43.875320     Document Type: Article

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