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Volumn 515, Issue 4, 2006, Pages 2635-2643

Justification of the Schottky emission model at the interface of a precious metal and a perovskite oxide with dilute oxygen vacancies

Author keywords

Capacitors; Oxygen vacancy; Perovskite; Schottky barrier

Indexed keywords

CAPACITORS; INTERFACES (MATERIALS); LEAKAGE CURRENTS; MICROELECTRONICS; PEROVSKITE;

EID: 33750802966     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.04.019     Document Type: Article
Times cited : (10)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.