Projected potential profiles across intergranular glassy films

Journal of the Ceramic Society of Japan

Volumn 114, Issue 1335, 2006, Pages 1005-1012

  Bhattacharyya, Somnath ^a,b   Koch, Christoph T ^a   Rühle, Manfred ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

Exit face wave function; Intergranular glassy film; Mean inner potential; Phase retrieval; Projected potential profile; Space charge; Through focal series; Transmission electron microscopy

Indexed keywords

CERAMIC MATERIALS; DOPING (ADDITIVES); ELECTRIC SPACE CHARGE; LANTHANUM COMPOUNDS; PLASTIC FILMS; SILICON NITRIDE; TRANSMISSION ELECTRON MICROSCOPY;

EXIT FACE WAVE FUNCTIONS; INTERGRANULAR GLASSY FILMS; MEAN INNER POTENTIAL; PHASE RETRIEVAL; PROJECTED POTENTIAL PROFILES; THROUGH FOCAL SERIES;

GLASS;

EID: 33750736664     PISSN: 09145400     EISSN: 13486535     Source Type: Journal    
DOI: 10.2109/jcersj.114.1005     Document Type: Article

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