Improved optical profiling using the spectral phase in spectrally resolved white-light interferometry

Applied Optics

Volumn 45, Issue 27, 2006, Pages 6965-6972

  Debnath, Sanjit Kumar ^a   Kothiyal, Mahendra Prasad ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

Author keywords

[No Author keywords available]

Indexed keywords

MONOCHROMATORS; OPTICAL SYSTEMS; OPTICAL VARIABLES MEASUREMENT; PHASE SHIFT;

MONOCHROMATIC CONSTITUENTS; OPTICAL-PATH DIFFERENCE; SPECTRALLY RESOLVED WHITE-LIGHT INTERFEROMETRY (SRWLI);

INTERFEROMETRY;

EID: 33750555338     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.45.006965     Document Type: Article

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