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Optics and Laser Technology
Volumn 28, Issue 7, 1996, Pages 485-489
Spectrally-resolved white-light interferometry as a profilometry tool
Author keywords

Interferometry; Profilometry; White light interferometry
Indexed keywords

INTERFEROMETERS; OPTICAL DEVICES; SPECTROSCOPIC ANALYSIS; SURFACE MEASUREMENT;
EID: 0030265077     PISSN: 00303992     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-3992(96)00018-7     Document Type: Article
Times cited : (50)
References (8)
  • 1
    • 0025418710 scopus 로고
    • Refractometry of liquid samples with spectrally resolved white light interferometry
    • Sainz, C., Calatroni, J., Tribillon, G. Refractometry of liquid samples with spectrally resolved white light interferometry, Measurements in Science and Technology, 1 (1990) 356-361 (also in Eng Opt (1990) 339-344)
    • (1990) Measurements in Science and Technology , vol.1 , pp. 356-361
    • Sainz, C.1    Calatroni, J.2    Tribillon, G.3
  • 2
    • 0025418710 scopus 로고
    • Sainz, C., Calatroni, J., Tribillon, G. Refractometry of liquid samples with spectrally resolved white light interferometry, Measurements in Science and Technology, 1 (1990) 356-361 (also in Eng Opt (1990) 339-344)
    • (1990) Eng Opt , pp. 339-344
  • 3
    • 0000390753 scopus 로고
    • Refractive index distribution measurements by means of spectrally resolved white-light interferometry
    • Guerrero, A.L., Sainz, C., Perrin, H., Castell, R., Calatroni, J. Refractive index distribution measurements by means of spectrally resolved white-light interferometry, Opt Laser Technol, 24 (1992) 333
    • (1992) Opt Laser Technol , vol.24 , pp. 333
    • Guerrero, A.L.1    Sainz, C.2    Perrin, H.3    Castell, R.4    Calatroni, J.5
  • 4
    • 0028484291 scopus 로고
    • Real time interferometric measurements of dispersion curves
    • Sainz, C., Jourdain, P., Escalona, R., Calatroni, J. Real time interferometric measurements of dispersion curves, Opt Comm, 110 (1994) 381-390
    • (1994) Opt Comm , vol.110 , pp. 381-390
    • Sainz, C.1    Jourdain, P.2    Escalona, R.3    Calatroni, J.4
  • 5
    • 84906876958 scopus 로고
    • Surface profiling by analysis of white light interferograms in the spatial frequency domain
    • de Groot, P., Deck, L. Surface profiling by analysis of white light interferograms in the spatial frequency domain, J Mod Opt, 42 (1995) 389-401
    • (1995) J Mod Opt , vol.42 , pp. 389-401
    • De Groot, P.1    Deck, L.2
  • 6
    • 0018005027 scopus 로고
    • Construction of an interferometric gauge system for thickness measurement in white light
    • Goedgebuer, J.P., Lacourt, A., Guignard, M. Construction of an interferometric gauge system for thickness measurement in white light, Opt Laser Technol, 10 (1978)
    • (1978) Opt Laser Technol , vol.10
    • Goedgebuer, J.P.1    Lacourt, A.2    Guignard, M.3
  • 7
    • 0028479462 scopus 로고
    • Dispersive interferometric profilometer
    • Schwider, J., Zhou, L. Dispersive interferometric profilometer, Opt Lett, 19 (1994)
    • (1994) Opt Lett , vol.19
    • Schwider, J.1    Zhou, L.2

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.