Recent advances in high-resolution X-ray diffractometry applied to nanostructured oxide thin films: The case of yttria stabilized zirconia epitaxially grown on sapphire

Applied Surface Science

Volumn 253, Issue 1 SPEC. ISS., 2006, Pages 95-105

  Boulle, A ^a   Guinebretiere R ^a   Masson, O ^a   Bachelet, R ^a   Conchon, F ^a   Dauger, A ^a  

^a UNIVERSITY OF LIMOGES   (France)

Author keywords

High resolution X ray diffraction; Lattice disorder; Microstructure; Modelling; Size and shape

Indexed keywords

CRYSTAL LATTICES; EPITAXIAL GROWTH; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; X RAY DIFFRACTION; ZIRCONIA;

DEFECT INTENSITIES; HIGH RESOLUTION X-RAY DIFFRACTION; LATTICE DISORDER; SOL GEL DIP COATING;

THIN FILMS;

EID: 33750507495     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.05.086     Document Type: Article

References (34)

1. Chambers S.A. Surf. Sci. Rep. 39 (2000) 105
2. Norton D.P. Mater. Sci. Eng. R 43 (2004) 139
3. Fernandez-Garcia M., Martinez-Arias A., Hanson J.C., and Rodriguez J.A. Chem. Rev. 104 (2004) 4063
4. Heinrich V.E., and Cox P.A. The Surface Science of Metal Oxides (1994), University Press, Cambridge p. 1
5. Pavlov K.M., and Punegov V.I. Acta Cryst. A 56 (2000) 227
6. Kirste L., Pavlov K.M., Mudie S.T., Punegov V.I., and Herres N. J. Appl. Cryst. 38 (2005) 183
7. Babkevich A.Y., Cowley R.A., Mason N.J., Weller S., and Stunault A. J. Phys.: Condens. Matter 14 (2002) 13505
8. Ratnikov V., Kyutt R., Shubina T., Paskova T., Valcheva E., and Monemar B. J. Appl. Phys. 88 (2000) 6252
9. Boulle A., Legrand C., Guinebretière R., Mercurio J.P., and Dauger A. Thin Sol. Films 391 (2001) 42
10. Boulle A., Canale L., Guinebretière R., Girault-Di bin C., and Dauger A. Thin Sol. Films 425 (2003) 55
11. A. Boulle, Ph.D. Thesis, University of Limoges, France, 2002.
12. Pietsch U., Holý V., and Baumbach T. High Resolution X-ray Scattering-From Thin Films to Lateral Nanostructures (2004), Springer Verlag, Berlin
13. Boulle A., Masson O., Guinebretière R., and Dauger A. Appl. Surf. Sci. 180 (2001) 322
14. Boulle A., Masson O., Guinebretière R., Lecomte A., and Dauger A. J. Appl. Cryst. 35 (2002) 606
15. Masson O., Boulle A., Guinebretière R., Lecomte A., and Dauger A. Rev. Sci. Inst. 76 (2005) 063912
16. Guinebretière R., Dauger A., Lecomte A., and Vesteghem H. J. Non-Cryst. Solids 147 (1992) 542
17. Boulle A., Pradier L., Masson O., Guinebretière R., and Dauger A. Appl. Surf. Sci. 188 (2002) 80
18. Miller K.T., Lange F.F., and Marshall D.B. J. Mater. Res. 5 (1990) 151
19. Sinha S.K., Tolan M., and Gibaud A. Phys. Rev. B 57 (1998) 2740
20. Boulle A., Guinebretière R., and Dauger A. J. Appl. Phys. 97 (2005) 073503-1
21. Kaganer V.M., Köhler R., Schmidbauer M., Optiz R., and Jenichen B. Phys. Rev. B 55 (1997) 1793
22. Nesterets Y.I., and Punegov V.I. Acta Cryst. A 56 (2000) 540
23. Zolotoyabko E. J. Appl. Cryst. 31 (1998) 241
24. Fullerton E.F., Schuller I.K., Vanderstraeten H., and Bruynseraede Y. Phys. Rev. B 45 (1992) 9292
25. Tsybulya S.V., Cherepanova S.V., and Kruykova G.N. In: Mittemeijer E.J., and Scardi P. (Eds). Diffraction Analysis of the Microstructure of Materials (2004), Springer, Berlin 93
26. Fujii Y., Ohnishi T., Ishihara T., Yamada Y., Kawaguchi K., Nakayama N., and Shinjo T. J. Phys. Soc. Jpn. 55 (1986) 251
27. Schmidbauer M. X-ray Diffuse Scattering from Self-organized Mesoscopic Semiconductor Structures (2004), Berlin, Springer p. 30
28. Boulle A., Guinebretière R., and Dauger A. J. Phys. IV (France) 118 (2004) 183
29. Warren B.E. X-ray diffraction (1969), Addison-Wesley, New York
30. Boulle A., Masson O., Guinebretière R., and Dauger A. J. Appl. Cryst. 36 (2003) 1424
31. Gibaud A., Cowley R.A., McMorrow D.F., Ward R.C.C., and Wells M.R. Phys. Rev. B 48 (1993) 14463
32. Miceli P.F., Weatherwax J., Krenstel T., and Palmstrøm C.J. Physica B 221 (1996) 230
33. Balzar D. In: Snyder R.L., Fiala J., and Bunge H.J. (Eds). Defect and Microstructure Analysis by Diffraction (1999), Oxford University Press 94
34. Vargas R., Louër D., and Langford J.I. J. Appl. Cryst. 16 (1983) 512