Characterization of Si nanocrystals into SiO 2 matrix

Applied Surface Science

Volumn 253, Issue 1 SPEC. ISS., 2006, Pages 385-388

  Gravalidis, C ^a   Logothetidis, S ^a   Hatziaras, N ^a   Laskarakis, A ^a   Tsiaoussis, I ^a   Frangis, N ^a  

^a ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

Author keywords

High resolution transmission electron microscopy; Optical density; Si nanocrystals; X rays reflectivity

Indexed keywords

ANNEALING; DENSITY (OPTICAL); GROWTH (MATERIALS); MULTILAYERS; SILICA; TRANSMISSION ELECTRON MICROSCOPY;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; SI NANOCRYSTALS; X-RAYS REFLECTIVITY (XRR);

NANOSTRUCTURED MATERIALS;

EID: 33750505682     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.06.019     Document Type: Article

References (18)

1. Lockwood D.J. Light Emission in Silicon: from Physics to Devices, Semiconductors and Semimetals vol. 49 (1998), Academic Press, San Diego
2. Lockwood D.J., Lu Z.H., and Baribeau J.-M. Phys. Rev. Lett. 76 (1996) 539
3. Photopoulos P., Nassiopoulou A.G., and Kouvatsos D.N. Appl. Phys. Lett. 76 (2000) 3588
4. Wang Y.Q., Kong G.L., Chen W.D., Diao H.W., Chen C.Y., Zhang S.B., and Liao X.B. Appl. Phys. Lett. 81 (2002) 4174
5. Bae J.-S., Choi S.-H., Kim K.J., and Moon D.W. J. Korean Phys. Soc. 43 (2003) 557
6. Khriachtchev L., Nivikov S., and Kilpelä O. J. Appl. Phys. 87 (2000) 7805
7. Lombardo S., Corso D., Crupi I., Gerardi C., Ammendola G., Melanotte M., De Salvo B., and Perniola L. Microelectron. Eng. 72 (2004) 411
8. Lee K.-J., Kang T.-D., Lee H., Hong S.H., Choi S.-H., Seong T.-Y., Kim K.J., and Moon D.W. Thin Solid Films 476 (2005) 196
9. Zacharias M., Tsybeskov L., Hirschman K.D., Fauchet P.M., Bläsing J., Kohlert P., and Veit P. J. Non-Cryst. Solids 227-230 (1998) 1132
10. Heitmann J., Scholz R., Schmidt M., and Zacharias M. J. Non-Cryst. Solids 299-302 (2002) 1075
11. Yi L.X., Heitmann J., Scholz R., and Zacharias M. J. Phys.: Condens. Matter 15 (2003) S2887
12. Yi L.X., Heitmann J., Scholz R., and Zacharias M. Appl. Phys. Lett. 81 (2002) 4248
13. Ioannou-Sougleridis V., Nassiopoulou A.G., and Travlos A. Nanotechnology 14 (2003) 1174
14. Parratt L.G. Phys. Rev. 95 (1954) 359
15. Nevot L., and Croce P. Rev. Phys. Appl. 15 (1980) 761
16. Daldosso N., et al. Phys. Rev. B 68 (2003) 085327
17. Laskarakis A., Gravalidis C., and Logothetidis S. Nucl. Instrum. Methods Phys. Res., Sect. B 216 (2004) 131
18. Vallon S., Drevillon B., and Poncin-Epaillard F. Appl. Surf. Sci. 108 (1997) 177