FTIR and Vis-FUV real time spectroscopic ellipsometry studies of polymer surface modifications during ion beam bombardment

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 216, Issue 1-4, 2004, Pages 131-136

  Laskarakis, A ^a   Gravalidis, C ^a   Logothetidis, S ^a  

^a ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

Author keywords

FTIR; Plasma treatment; Polymer; Spectroscopic ellipsometry; Vis FUV

Indexed keywords

ARGON; CHEMICAL BONDS; ELLIPSOMETRY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; ION BEAMS; ION BOMBARDMENT; POSITIVE IONS; SURFACE TREATMENT;

ELECTRONIC TRANSITIONS; PLASMA TREATMENT; SURFACE ADHESION;

POLYMERS;

EID: 1042277345     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2003.11.033     Document Type: Conference Paper

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