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Volumn 100, Issue 7, 2006, Pages

Depth profiling of strain and defects in Si/Si1-xGe x/Si heterostructures by micro-Raman imaging

Author keywords

[No Author keywords available]

Indexed keywords

FILM CRYSTALLINITY; MICRO RAMAN IMAGING; STRAIN VARIATION;

EID: 33749990853     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2355431     Document Type: Article
Times cited : (14)

References (36)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.