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Volumn 6342 II, Issue , 2006, Pages

The optical design for microlithographic lenses

Author keywords

[No Author keywords available]

Indexed keywords

MICROLITHOGRAPHIC LENS;

EID: 33749827694     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.692315     Document Type: Conference Paper
Times cited : (10)

References (17)
  • 1
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    • T.Matsuyama, et al., "The Lithographic Lens: its history and evolution", SPIE Vol. 6154, (2006)
    • (2006) SPIE , vol.6154
    • Matsuyama, T.1
  • 3
    • 33749840816 scopus 로고    scopus 로고
    • US Patent 5,930,049
    • Y.Suenaga, et al., US Patent 5,930,049
    • Suenaga, Y.1
  • 4
    • 33749857846 scopus 로고    scopus 로고
    • Japan Patent 2000,56218
    • K. Yamaguchi, et al., Japan Patent 2000,56218
    • Yamaguchi, K.1
  • 5
    • 33749853389 scopus 로고    scopus 로고
    • US Patent 6,864,961
    • Y. Ohmura US Patent 6,864,961
    • Ohmura, Y.1
  • 6
    • 0036415503 scopus 로고    scopus 로고
    • High NA and low residual aberration projection lens for DUV scanner
    • T. Matsuyama, et al., "High NA and low residual aberration projection lens for DUV scanner", SPIE Vol. 4691, (2002)
    • (2002) SPIE , vol.4691
    • Matsuyama, T.1
  • 7
    • 3843146040 scopus 로고    scopus 로고
    • Nikon projection lens update
    • T. Matsuyama, et al., "Nikon Projection Lens Update", SPIE Vol. 5377, (2004)
    • (2004) SPIE , vol.5377
    • Matsuyama, T.1
  • 8
    • 0034512685 scopus 로고    scopus 로고
    • Trends in optical design of projection lenses for UV- and EUV-lithography
    • San Diego
    • W. Ulrich et al., "Trends in Optical Design of Projection Lenses for UV- and EUV-Lithography", SPIE 2000, San Diego
    • SPIE 2000
    • Ulrich, W.1
  • 9
    • 33749839289 scopus 로고    scopus 로고
    • Japan Patent 2004,205698
    • Y. Ohmura, et al., Japan Patent 2004,205698
    • Ohmura, Y.1
  • 10
    • 0038688070 scopus 로고    scopus 로고
    • High NA projection lens designs for exposure tools
    • T.Ishiyama, et al., "High NA projection lens designs for exposure tools", SPIE Vol. 4832, (2002)
    • (2002) SPIE , vol.4832
    • Ishiyama, T.1
  • 11
    • 29144468128 scopus 로고    scopus 로고
    • Remaining challenges in microlithographic optical design
    • San Diego
    • D. M. Williamson, "Remaining challenges in microlithographic optical design", SPIE2005, San Diego
    • SPIE2005
    • Williamson, D.M.1
  • 12
    • 0141722295 scopus 로고    scopus 로고
    • Catadioptric lens development for DUV and VUV projection optics
    • Y.Ohmura, et al., "Catadioptric lens development for DUV and VUV projection optics", SPIE Vol. 5040, (2003)
    • (2003) SPIE , vol.5040
    • Ohmura, Y.1
  • 13
    • 33745781257 scopus 로고    scopus 로고
    • Hyper-NA projection lens for ArF immersion exposure tool
    • H. Ikezawa, et al., "hyper-NA projection lens for ArF immersion exposure tool", SPIE Vol. 6154, (2006)
    • (2006) SPIE , vol.6154
    • Ikezawa, H.1
  • 14
    • 33749858621 scopus 로고    scopus 로고
    • US Patent 6,362,926
    • Y. Ohmura US Patent 6,362,926
    • Ohmura, Y.1
  • 15
    • 33749868691 scopus 로고    scopus 로고
    • European Patent 1069448
    • Y. Suenaga, et al., European Patent 1069448
    • Suenaga, Y.1
  • 16
    • 33745803834 scopus 로고    scopus 로고
    • Catadioptric lens design: The brealthrough to hyper-NA optics
    • B. Kneer, et al., "Catadioptric lens design: the brealthrough to hyper-NA optics", SPIE Vol. 6154, (2006)
    • (2006) SPIE , vol.6154
    • Kneer, B.1
  • 17
    • 33745768605 scopus 로고    scopus 로고
    • Current status and future prospect of immersion lithography
    • S. Owa, et al., "Current status and future prospect of immersion lithography", SPIE Vol. 6154, (2006)
    • (2006) SPIE , vol.6154
    • Owa, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.