Structural characterization of Ni2Si pseudoepitaxial transrotational structures on [001] Si

Acta Crystallographica Section B: Structural Science

Volumn 62, Issue 5, 2006, Pages 729-736

  Alberti, Alessandra ^a   Bongiorno, Corrado ^a   Alippi, Paola ^a   La Magna, Antonino ^a   Spinella, Corrado ^a   Rimini, Emanuele ^a  

^a CNR IMM   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; EPITAXIAL GROWTH; LATTICE CONSTANTS; LAYERED MANUFACTURING; SILICON; SUBSTRATES;

BENDING CONTOURS; SILICON LATTICE; STRUCTURAL CHARACTERIZATION; TRANSROTATIONAL STRUCTURES;

NICKEL COMPOUNDS;

EID: 33749393961     PISSN: 01087681     EISSN: 01087681     Source Type: Journal    
DOI: 10.1107/S0108768106029727     Document Type: Article

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