Energy and integrated dose dependence of MOSFET dosimeter sensitivity for irradiation energies between 30 kV and 60Co

Medical Physics

Volumn 33, Issue 10, 2006, Pages 3683-3689

  Lavallée, Marie Claude ^a   Gingras, Luc ^a   Beaulieu, Luc ^a  

^a NONE

Author keywords

Calibration factor; Dosimetry; MOSFET

Indexed keywords

CALIBRATION; DIAGNOSIS; DOSIMETRY; ELECTRIC FIELDS; GAMMA RAYS; IRRADIATION; MEDICAL APPLICATIONS; METALS; MOS DEVICES; OXIDE SEMICONDUCTORS; RADIOLOGY; RADIOTHERAPY; SILICA; SILICON; THRESHOLD VOLTAGE; X RAYS;

CALIBRATION FACTORS; ENERGY APPLICATIONS; INTERVENTIONAL RADIOLOGY; LOW-ENERGY RADIATION; MEASUREMENT ACCURACY; MOS-FET; SI-SIO2 INTERFACES; TOTAL INTEGRATED DOSE;

MOSFET DEVICES;

ACCURACY; ARTICLE; CALIBRATION; DEVICE; DOSE RESPONSE; DOSIMETER; ELECTRIC POTENTIAL; ENERGY; IRRADIATION; LOW ENERGY RADIATION; METAL OXIDE SEMICONDUCTOR FIELD EFFECT TRANSISTOR; PRIORITY JOURNAL; X RAY;

EID: 33749392945     PISSN: 00942405     EISSN: None     Source Type: Journal    
DOI: 10.1118/1.2349301     Document Type: Article

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