Comparison study of MOSFET detectors and diodes for entrance in vivo dosimetry in 18 MV x-ray beams

Medical Physics

Volumn 31, Issue 9, 2004, Pages 2534-2542

  Jornet, N ^a   Carrasco, P ^a   Jurado, D ^a   Ruiz, A ^a   Eudaldo, T ^a   Ribas, M ^a  

^a HOSPITAL DE LA SANTA CREU I SANT PAU   (Spain)

Author keywords

Correction factors; Diode detectors; Entrance dose measurements; In vivo dosimetry; MOSFET

Indexed keywords

CALIBRATION; DOSIMETRY; METALS; MOS DEVICES; OXIDE SEMICONDUCTORS; PATIENT TREATMENT; RADIATION DECONTAMINATION; SEMICONDUCTOR DIODES; SENSITIVITY ANALYSIS; UNCERTAINTY ANALYSIS; X RAY DETECTORS; X RAYS;

CORRECTION FACTORS; DIODE DETECTORS; DOSE MEASUREMENT; IN-VIVO; MOS-FET;

MOSFET DEVICES;

METAL OXIDE;

ARTICLE; CALIBRATION; COMPARATIVE STUDY; DIODE; DOSIMETRY; IN VIVO STUDY; PRIORITY JOURNAL; RADIATION DETECTOR; SEMICONDUCTOR; TEMPERATURE; X RAY;

EID: 4644311758     PISSN: 00942405     EISSN: None     Source Type: Journal    
DOI: 10.1118/1.1785452     Document Type: Article

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