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Volumn 32, Issue 6, 2005, Pages 2003-
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SU‐FF‐T‐232: Characterization and Use of MOSFET as In Vivo Dosimeters under 192Ir Irradiation for Real‐Time Quality Assurance
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 33749391308
PISSN: 00942405
EISSN: None
Source Type: Journal
DOI: 10.1118/1.1997960 Document Type: Article |
Times cited : (4)
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References (0)
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