Single atomic layer detection of Ca and defect characterization of Bi-2212 with EELS in HA-ADF STEM

Ultramicroscopy

Volumn 106, Issue 11-12 SPEC. ISS., 2006, Pages 1076-1081

  Zhu, Ye ^a   Niewczas, Marek ^a   Couillard, Martin ^a   Botton, Gianluigi A ^a  

^a MCMASTER UNIVERSITY   (Canada)

Author keywords

Bi 2212; EELS; HA ADF STEM; Z contrast

Indexed keywords

ANGLE MEASUREMENT; BISMUTH COMPOUNDS; ELECTRON ENERGY LOSS SPECTROSCOPY; MOLECULAR STRUCTURE; SIGNAL PROCESSING; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC LAYER DETECTIONS; BI-2212; CACU2O8+; SPATIAL RESOLUTIONS;

CALCIUM;

BISMUTH; CALCIUM; COPPER; OXYGEN; STRONTIUM;

ARTICLE; CALCIUM SIGNALING; CHEMICAL COMPOSITION; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; ELECTRON ENERGY LOSS SPECTROSCOPY; IMAGING; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SIGNAL TRANSDUCTION;

EID: 33749386215     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2006.04.022     Document Type: Article

References (34)

1. Müller D.A., Nakagawa N., Ohtomo A., Grazul J.L., and Hwang H.Y. Nature 430 (2004) 657
2. Batson P.E. Ultramicroscopy 78 (1999) 33
3. Voyles P.M., Müller D.A., Grazul J.L., Citrin P.H., and Gossmann H.-J. Nature 416 (2002) 826
4. Shibata N., Pennycook S.J., Gosnell T.R., Painter G.S., Shelton W.A., and Becher P.F. Nature 428 (2004) 730
5. Varela M., Findlay S.D., Lupini A.R., Christen H.M., Borisevich A.Y., Dellby N., Krivanek O.L., Nellist P.D., Oxley M.P., Allen L.J., and Pennycook S.J. Phys. Rev. Lett. 92 (2004) 095502
6. Ohtomo A., Müller D.A., Grazul J.L., and Hwang H.Y. Nature 419 (2002) 378
7. Maeda H., Tanaka Y., Fukutomi M., and Asano T. Jpn. J. Appl. Phys. 27 (1988) L209
8. Matsui Y., Maeda H., Tanaka Y., and Horiuchi S. Jpn. J. Appl. Phys. 27 (1988) L372
9. Grebille D., Leligny H., Ruyter A., Labbé P.H., and Raveau B. Acta Crystallogr. B 52 (1996) 628
10. Eibl O. Physica C 168 (1990) 239
11. Maeda H., Tanaka Y., Fukutomi M., Asano T., Togano K., Kumakura H., Uehara M., Ikeda S., Ogawa K., Horiuchi S., and Matsui Y. Physica C 153 (1988) 602
12. Yamamoto A., Onoda M., Takayama-Muromachi E., Izumi F., Ishigaki T., and Asano H. Phys. Rev. B 42 (1990) 4228
13. Budin H., Eibl O., Pongratz P., and Skalicky P. Physica C 207 (1993) 208
14. Eibl O. Physica C 168 (1990) 215
15. Matsui Y., Maeda H., Tanaka Y., Takayama-Muromachi E., Takekawa S., and Horiuchi S. Jpn. J. Appl. Phys. 27 (1988) L827
16. Ikeda S., Sato J., and Nakamura K. Mater. Trans. JIM 31 (1990) 602
17. Tsu I., Wang J., Kaiser D.L., and Babcock S.E. Physica C 306 (1998) 163
18. Eibl O. Physica C 168 (1990) 249
19. Zhao Y., Gu G.D., Russell G.J., Nakamura N., Tajima S., Wen J.G., Uehara K., and Koshizuka N. Phys. Rev. B 51 (1995) 3134
20. Huang Y., Wang B., Hong M., and Wu M. Physica C 235-240 (1994) 525
21. Tsu I., Wang J., Babcock S.E., Polyanskii A.A., Larbalestier D.C., and Sickafus K.E. Physica C 349 (2001) 8
22. Furusawa K., Zhao Y., Chikumoto N., Kishio K., Nagatomo T., and Murakami M. Physica C 392-396 (2003) 353
23. Lang K.M., Madhavan V., Hoffman J.E., Hudson E.W., Eisaki H., Uchida S., and Davis J.C. Nature 415 (2002) 412
24. Nabialek A., Niewczas M., Dabkowska H., Dabkowski A., Castellan J.P., and Gaulin B. Phys. Rev. B 67 (2003) 1
25. Nabialek A., Chabanenko V., Rusakov V., Vasiliev S., Szymczak H., Piechotoa S., Dabkowska H., Dabkowski A., Gaulin B.D., Niewczas M., and Mironov O. J. Low Temp. Phys. 130 (2003) 425
26. James E.M., and Browning N.D. Ultramicroscopy 78 (1999) 125
27. Le Page Y., McKinnon W.R., Tarascon J.M., and Barboux P. Phys. Rev. B. 40 (1989) 6810
28. Pennycook S.J., and Boatner L.A. Nature 336 (1988) 565
29. Kishida K., and Browning N.D. Physica C 351 (2001) 281
30. Batson P.E. Nature 366 (1988) 727
31. Krivanek O.L., Kundmann M.K., and Kimoto K. J. Microsc. 180 (1995) 277
32. Hÿtch M.J., Snoeck E., and Kilaas R. Ultramicroscopy 74 (1998) 131
33. Heeb B., Gauckler L.J., Heinrich H., and Kostorz G. J. Mater. Res. 8 (1993) 2170
34. Otsuka J., Yamamoto O., Sugihara Y., Senzaki T., Ohbayashi K., Inoue M., Fujimaki A., and Hayakawa H. Physica C 331 (2000) 164