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Physica C: Superconductivity and its Applications

Volumn 351, Issue 3, 2001, Pages 281-294

Direct atomic scale imaging of grain boundaries and defects in Bi-2223/Ag high-Tc superconducting tapes

(2) Kishida, K b Browning, N D a

a UNIVERSITY OF ILLINOIS AT CHICAGO (United States)

b NATIONAL INSTITUTE FOR MATERIALS SCIENCE (Japan)

Author keywords

Defect structures; Grain boundaries; Scanning transmission electron microscopy; Z contrast

Indexed keywords

BISMUTH COMPOUNDS; CRYSTAL STRUCTURE; GRAIN BOUNDARIES; HIGH TEMPERATURE SUPERCONDUCTORS; IMAGE ANALYSIS; SUPERCONDUCTING TAPES; TRANSMISSION ELECTRON MICROSCOPY;

DEFECT STRUCTURES;

SUPERCONDUCTING FILMS;

EID: 0035311931 PISSN: 09214534 EISSN: None Source Type: Journal
DOI: 10.1016/S0921-4534(00)01625-7 Document Type: Article

Times cited : (14)

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