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Volumn 72, Issue 8, 2005, Pages

Effects of beam-specimen interaction on the observation of reverse-biased p-n junctions by electron interferometry

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Indexed keywords


EID: 33749159195     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.72.085312     Document Type: Article
Times cited : (13)

References (19)
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    • Beleggia, M.1    Fazzini, P.F.2    Pozzi, G.3
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