Electron microscope calibration for the Lorentz mode

Ultramicroscopy

Volumn 99, Issue 2-3, 2004, Pages 201-209

  Fazzini, P F ^a   Merli, P G ^b   Pozzi, G ^a  

^a UNIVERSITY OF BOLOGNA   (Italy)

^b CNR   (Italy)

Author keywords

68.37.Lp; 85.30.De; 87.64.Ee; Calibration; Electron microscopy; Lorentz microscopy; p n junctions

Indexed keywords

CALIBRATION; DIFFRACTOMETERS; ELECTRIC FIELDS; ELECTRON DIFFRACTION; ELECTRON MICROSCOPES;

FRESNEL DIFFRACTION; FRINGE ANALYSIS; LORENTZ MODE; LOW-ANGLE ELECTRON DIFFRACTION;

ELECTROSTATICS;

ARTICLE; CALIBRATION; ELECTRICITY; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; MATHEMATICAL COMPUTING;

EID: 1942452774     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2004.01.002     Document Type: Article

References (18)

1. Tonomura A. Electron Holography. 1993;Springer, Berlin.
2. Chapman J.N. J. Phys. D. 17:1984;623.
3. Beleggia M., Fazzini P.F., Merli P.G., Pozzi G. Phys. Rev. B. 67:2003;045328.
4. A. Barty, D. Paganin, K. Nugent, Phase retrieval in Lorentz microscopy, in: R. Celotta, T. Lucatorto (Eds.), Magnetic Imaging and its Applications to Materials, Experimental Methods in the Physical Science, Vol. 36, Academic Press, 2001, pp. 137-166 (Chapter 5).
5. R.P. Ferrier, Low angle electron diffraction, in: R. Barer, V.E. Cosslett (Eds.), Advances in Optical and Electron Microscopy, Vol. 3, Academic Press, New York, 1969, pp. 155-217.
6. Reimer L., Kappert H. Z. Angew. Phys. 27(3):1969;165.
7. Reimer L., Heine H.G., Ajeian R. Z. Naturfosch. 24a:1969;1846.
8. Reimer L. Transmission Electron Miscroscopy. 1984;Springer, Berlin.
9. Heidenreich R.D., Hess W.M., Ban L.L. J. Appl. Crystallogr. 1(1):1968;1.
10. Born M., Wolf E. Principles of Optics. 1989;Pergamon Press, New York.
11. W. Glaser, in: S. Flügge (Ed.), Handbuch der Physik, Vol. 33, Springer Berlin, 1956, pp. 123-395.
12. Glaser W. Grundlagen der Elektronopik. 1952;Springer, Vienna, Berlin.
13. Glaser W., Schiske P. Ann. Phys. 12:1953;240.
14. Thon F. Z. Naturfosch. 20a:1965;154.
15. Thon F. Z. Naturfosch. 21a:1966;476.
16. Thon F. Phase contrast electron microscopy. Valdré U. Electron Microscopy in Material Sciences. 1971;570-625 Academic Press, New York.
17. Vanzi M. Optik. 58(2):1981;103.
18. Beleggia M., Capelli R., Pozzi G. Philos. Mag. B. 80:2000;1071.