Determination of the electron inelastic mean free path in some binary alloys for application in quantitative surface analysis

Applied Surface Science

Volumn 235, Issue 1-2, 2004, Pages 15-20

  Krawczyk, M ^a   Zommer, L ^a   Sobczak, J W ^a   Jablonski, A ^a  

^a INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

Author keywords

Binary alloys; Elastic peak electron spectroscopy; Electron inelastic mean free path; Electron spectroscopies; Quantitative surface analysis

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; COMPOSITION; ELECTRON TRANSPORT PROPERTIES; SPECTROMETERS; SURFACE PHENOMENA; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

ELASTIC PEAK ELECTRON SPECTROSCOPY; ELECTRON ENERGY; MEAN FREE PATH; QUANTITATIVE SURFACE ANALYSIS;

BINARY ALLOYS;

EID: 4344634831     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.05.117     Document Type: Conference Paper

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