Intercomparison of methods for separation of REELS elastic peak intensities for determination of IMFP

Surface and Interface Analysis

Volumn 31, Issue 1, 2001, Pages 1-10

  Tougaard, S ^a   Krawczyk, M ^b   Jablonski, A ^b   Pavluch, J ^c   Toth, J ^d   Varga, D ^d   Gergely, G ^e   Menyhard, M ^e   Sulyok, A ^e  

^a UNIVERSITY OF SOUTHERN DENMARK   (Denmark)

^b INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

^c CHARLES UNIVERSITY   (Czech Republic)

^d INSTITUTE OF EXPERIMENTAL MEDICINE   (Hungary)

^e RESEARCH INSTITUTE FOR TECHNICAL PHYSICS AND MATERIALS SCIENCE   (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; ELECTRON ENERGY LOSS SPECTROSCOPY; MATHEMATICAL MODELS; SPECTROMETERS; STATISTICAL METHODS; SURFACE STRUCTURE;

BACKGROUND CORRECTION; DOUBLE PASS CYLINDRICAL MIRROR ANALYSER; ELASTIC PEAK ELECTRON SPECTROSCOPY; HEMISPHERICAL ANALYSER; INELASTIC ELECTRON MEAN FREE PATH; PRE-RETARDED CYLINDRICAL MIRROR ANALYSER; QUANTITATIVE SURFACE ANALYSIS; REFLECTED ELECTRON ENERGY LOSS SPECTROSCOPY; RETARDING FIELD ANALYSER;

ELECTRONS;

EID: 0035126354     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.945     Document Type: Article

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