An investigation into the surface topology and thickness profile of functional ceramic spinel manganate sputtered, evaporated and screen-printed layers

Applied Surface Science

Volumn 252, Issue 24, 2006, Pages 8760-8767

  Schmidt, R ^a   Basu, A ^a   Brinkman, A W ^a   Klusek, Z ^b   Kozlowski, W ^b   Datta, S ^b   Stiegelschmitt, A ^c   Roosen, A ^c  

^a DURHAM UNIVERSITY   (United Kingdom)

^b NORTHUMBRIA UNIVERSITY   (United Kingdom)

^c UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

Atomic force microscopy (AFM); Ceramic; Densification; Grain growth; Layer; Porosity; Scanning electron microscopy (SEM); Sensor

Indexed keywords

EVAPORATION; GRAIN GROWTH; HEAT RESISTANCE; POROSITY; SCANNING ELECTRON MICROSCOPY; SPUTTERING; SURFACE TOPOGRAPHY;

NEGATIVE TEMPERATURE COEFFICIENT OF RESISTANCE (NTCR); POST-DEPOSITION ANNEALING; SURFACE POROSITY;

CERAMIC MATERIALS;

EID: 33749126778     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.01.020     Document Type: Article

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