Structural properties of rf magnetron sputter deposited nickel manganate thin films

Surface Science

Volumn 595, Issue 1-3, 2005, Pages 239-248

  Schmidt, R ^a,c   Basu, A ^a   Brinkman, A W ^a   Hase, T P A ^a   Klusek, Z ^b   Pierzgalski, S ^b   Datta, P K ^b  

^a DURHAM UNIVERSITY   (United Kingdom)

^b NORTHUMBRIA UNIVERSITY   (United Kingdom)

^c UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

Atomic force microscopy; Ceramic thin films; Crystallization; Grain boundaries; Nickel manganese oxide; Sputter deposition; Surface structure; X ray diffraction

Indexed keywords

ANNEALING; ARGON; ATOMIC FORCE MICROSCOPY; CRYSTALLOGRAPHY; DEPOSITION; GRAIN BOUNDARIES; MAGNETRON SPUTTERING; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; SINTERING; SURFACE STRUCTURE; SURFACES; X RAY DIFFRACTION ANALYSIS;

CERAMIC THIN FILMS; MANGANITES; NICKEL MANGANESE OXIDE; SURFACE DEPOSITION;

THIN FILMS;

EID: 27644457146     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2005.08.018     Document Type: Article

References (29)

1. J. Töpfer, A. Feltz, D. Gräf, B. Hackl, L. Raupach, and P. Weissbrodt Phys. Status Solidi A 134 1992 405
2. M. Parlak, T. Hashemi, M.J. Hogan, and A.W. Brinkman J. Mater. Sci. Lett. 17 1998 1995
3. R. Schmidt, A. Stiegelschmitt, A. Roosen, and A.W. Brinkman Key Eng. Mat. 206-213 2002 1417
4. R. Schmidt, A. Stiegelschmitt, A. Roosen, and A.W. Brinkman J. Eur. Ceram. Soc. 23 10 2003 1549
5. P. Fau, J.P. Bonino, J.J. Demai, and A. Rousset Appl. Surf. Sci. 65/66 1993 319
6. A. Basu, A.W. Brinkman, and R. Schmidt J. Eur. Ceram. Soc. 24 6 2004 1247
7. R. Schmidt, A. Basu, and A.W. Brinkman J. Eur. Ceram. Soc. 24 6 2004 1233
8. S. Baliga, and A.L. Jain Mater. Lett. 8 5 1989 175
9. D.G. Wickham J. Inorg. Nucl. Chem. 26 1964 1369
10. A. Feltz, and J. Töpfer Z. Anorg. Allg. Chem. 576 1989 71
11. D. Mehandjiev, A. Naydenov, and G. Ivanov Appl. Catal. A-Gen. 206 2001 13
12. G. Ashcroft, I. Terry, R. Gover, J. Eur. Ceram. Soc., in press.
13. S. Baliga, A.L. Jain, and W. Zachofsky Appl. Phys. A-Mater. 50 1990 472
14. R. Schmidt, and A.W. Brinkman Int. J. Inorg. Mater. 3 2001 1215
15. A. Basu, A.W. Brinkman, R. Schmidt, Z. Klusek, P. Kowalczyk, and P.K. Datta J. Eur. Ceram. Soc. 24 6 2004 1149
16. R. Schmidt, A. Basu, A.W. Brinkman, Z. Klusek, and P.K. Datta Appl. Phys. Lett. 86 7 2005 073501
17. A. Basu, A.W. Brinkman, Z. Klusek, P.K. Datta, and P. Kowalczyk J. Appl. Phys. 92 2002 4123
18. A. Basu, PhD thesis, Department of Physics, University of Durham, 2002.
19. M.A. Cousins, PhD thesis, Department of Physics, University of Durham, 2001.
20. C.S. Pande Acta Metall. 35 11 1987 2671
21. M.A. Cousins, and K. Durose Thin Solid Films 361-362 2000 253
22. R.A. Young The Rietveld Method IUCr Monographs on Crystallography vol. 5 1993 Oxford Science Publications Oxford
23. A. Pasquarello, M.S. Hybertsen, and R. Car Nature 396 1998 58
24. T. Akiyama, and H. Kageshima Surf. Sci. 576 2005 L65
25. G.K. Williamson, and W.H. Hall Acta Metall. 1 1953 22
26. A. Guinier X-ray Diffraction in Crystals, Imperfect Crystals and Amorphous Bodies 1994 Dover Publications New York
27. G. He, M. Liu, L.Q. Zhu, M. Chang, Q. Zhang, and L.D. Zhang Surf. Sci. 576 2005 67
28. D.-F. Liu, J.-L. Huang, I.-J. Jen, S.-S. Lin, and P. Sajgalik Surf. Coat. Tech. 192 2005 106
29. S. Baliga, A.L. Jain, in: Proceedings of the 2nd International Conference on Electronic Materials, 1990, p. 393.