Electron beam evaporation of nickel manganite thin-film negative temperature coefficient thermistors

Journal of Materials Science Letters

Volumn 17, Issue 23, 1998, Pages 1995-1997

  Parlak, M ^a   Hashemi, T ^b   Hogan, M J ^b   Brinkman, A W ^b  

^a MIDDLE EAST TECHNICAL UNIVERSITY   (Turkey)

^b DURHAM UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CALCINATION; CRYSTAL STRUCTURE; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRON BEAMS; EVAPORATION; GRAIN SIZE AND SHAPE; NICKEL COMPOUNDS; THICKNESS MEASUREMENT; THIN FILM DEVICES;

ELECTRON BEAM EVAPORATION; NICKEL MANGANITE;

THERMISTORS;

EID: 0032266721     PISSN: 02618028     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1006612706903     Document Type: Article

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