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Physical Review B - Condensed Matter and Materials Physics

Volumn 64, Issue 12, 2001, Pages 1254041-1254048

Berreman effect applied to phase characterization of thin films supported on metallic substrates: The case of TiO2

(5) Trasferetti, B C a Davanzo, C U a Zoppi, R A b Da Cruz, N C a De Moraes, M A B a

a UNIVERSITY OF CAMPINAS (Brazil)

b PONTIFÍCIA UNIVERSIDADE CATÓLICA DE CAMPINAS (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; METAL DERIVATIVE; PLATINUM; TITANIUM DIOXIDE;

ACCURACY; ANALYTIC METHOD; ARTICLE; CALCULATION; DIELECTRIC CONSTANT; FILM; INFRARED SPECTROSCOPY; INTERMETHOD COMPARISON; LIGHT; MATHEMATICAL ANALYSIS; OPTICS; PHASE TRANSITION; POWDER; REFLECTOMETRY; SIMULATION; STRUCTURE ANALYSIS; THEORY; VALIDATION PROCESS; VAPOR;

EID: 0035883460 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (35)

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