Observation of the quantum-confinement effect in individual β-FeSi2 nanoislands epitaxially grown on Si (111) surfaces using scanning tunneling spectroscopy

Applied Physics Letters

Volumn 89, Issue 12, 2006, Pages

  Nakamura, Yoshiaki ^a,b   Suzuki, Ryota ^a   Umeno, Masafumi ^a   Cho, Sung Pyo ^b,c   Tanaka, Nobuo ^b,c   Ichikawa, Masakazu ^a,b  

^a UNIVERSITY OF TOKYO   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c NAGOYA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EPITAXIAL GROWTH; IRON COMPOUNDS; QUANTUM THEORY; SCANNING TUNNELING MICROSCOPY; SILICON COMPOUNDS;

CODEPOSITION; ENERGY BAND GAPS; NANOISLANDS; QUANTUM-CONFINEMENT EFFECT;

NANOSTRUCTURED MATERIALS;

EID: 33748984298     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2349842     Document Type: Article

References (17)

1. M. C. Bost and J. E. Mahan, J. Appl. Phys. 58, 2696 (1985).
2. D. Leong, M. Harry, K. J. Reeson, and K. P. Homewood, Nature (London) 387, 686 (1997).
3. T. Suemasu, Y. Negishi, K. Takakura, and F. Hasegawa, Jpn. J. Appl. Phys., Part 2 39, L1013 (2000).
4. Y. Maeda, Y. Terai, M. Itakura, and N. Kuwano, Thin Solid Films 461, 160 (2004).
5. L. Miglio, V. Meregalli, and O. Jepsen, Appl. Phys. Lett. 75, 385 (1999).
6. K. Yamaguchi and K. Mizushima, Phys. Rev. Lett. 86, 6006 (2001).
7. J. Alvarez, A. L. Vázquez de Parga, J. J. Hinarejos, J. de la Figuera, E. G. Michel, C. Ocal, and R. Miranda, J. Vac. Sci. Technol. A 11, 929 (1993).
8. Y. Nakamura, Y. Nagadomi, S.-P. Cho, N. Tanaka, and M. Ichikawa, Phys. Rev. B 72, 075404 (2005).
9. Y. M. Niquet, G. Allan, C. Delerue, and M. Lannoo, Appl. Phys. Lett. 77, 1182 (2000).
10. C. Bostedt, T. Van Buuren, T. M. Willey, N. Franco, and L. J. Terminello, C. Heske, and T. Möller, Appl. Phys. Lett. 84, 4056 (2004).
11. Y. Nakamura, K. Watanabe, Y. Fukuzawa, and M. Ichikawa, Appl. Phys. Lett. 87, 133119 (2005).
12. L. Martinelli, E. Grilli, D. B. Migas, L. Miglio, F. Marabelli, C. Soci, M. Geddo, M. G. Grimaldi, and C. Spinella, Phys. Rev. B 66, 085320 (2002).
13. K. Okajima, H. Yamatsugu, C. Wen, N. Sudoh, and K. Yamada, Thin Solid Films 381, 267 (2001).
14. Y. Nakamura, Y. Nagadomi, S.-P. Cho, N. Tanaka, and M. Ichikawa, 100, 044313 (2006).
15. J. E. Mahan, V. L. Thanh, J. Chevrier, I. Berbezier, J. Derrien, and R. G. Long, J. Appl. Phys. 74, 1747 (1993).
16. M. Prietsch, A. Samsavar, and R. Ludeke, Phys. Rev. B 43, 11850 (1991).
17. P. Muret, K. Lefki, T. T. A. Nguyen, A. Cola, and I. Ali, Semicond. Sci. Technol. 9, 1395 (1994).