A comparative study between inductively and capacitively coupled plasma deposited polystyrene films: Chemical and morphological characterizations

Surface and Interface Analysis

Volumn 38, Issue 9, 2006, Pages 1266-1275

  Marie, Haïdopoulos ^a   Jérome, Larrieu ^a   Matthieu, Horgnies ^b   Laurent, Houssiau ^a   Jean Jacques, Pireaux ^a  

^a UNIVERSITY OF NAMUR   (Belgium)

^b UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

Author keywords

AFM; Plasma; Polystyrene; SEM; ToF SIMS; XPS

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONTACT ANGLE; FOURIER TRANSFORM INFRARED SPECTROSCOPY; INDUCTIVELY COUPLED PLASMA; MICROSTRUCTURE; POLYSTYRENES; SCANNING ELECTRON MICROSCOPY; STAINLESS STEEL; X RAY PHOTOELECTRON SPECTROSCOPY;

CAPACITIVELY COUPLED PLASMA; DISCHARGE PLASMA; PLASMA POLYMERIZED POLYSTYRENE (PPS); POLYSTYRENE FILMS; TOF-SIMS;

PLASTIC FILMS;

EID: 33748932394     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2388     Document Type: Article

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