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Journal of Electron Spectroscopy and Related Phenomena

Volumn 121, Issue 1-3, 2001, Pages 111-129

Chemical analysis of plasma-polymerized films: The application of X-ray photoelectron spectroscopy (XPS), X-ray absorption spectroscopy (NEXAFS) and fourier transform infrared spectroscopy (FTIR)

(4) Retzko, I a Friedrich, J F a Lippitz, A a Unger, W E S a

a BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING (Germany)

Author keywords

Acetylene; Butadiene; Chemical characterization; Deposition process; Ethylene; FTIR; NEXAFS; Plasma polymer; Stability; Styrene; XPS

Indexed keywords

ABSORPTION SPECTROSCOPY; DEPOSITION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MONOMERS; POLYMERIZATION; X RAY PHOTOELECTRON SPECTROSCOPY;

PLASMA POLYMERS;

PLASTIC FILMS;

EID: 0035545793 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/S0368-2048(01)00330-9 Document Type: Article

Times cited : (117)

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