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Volumn 508, Issue 1-2, 2006, Pages 74-77

Growth evolution of Sr-silicide layers on Si(111) and Mg2Si/Si(111) substrates

Author keywords

Diffusion; Interfaces; Silicides; Structural properties

Indexed keywords

DEPOSITION; DIFFUSION; INTERFACES (MATERIALS); SILICON; STRONTIUM COMPOUNDS; SUBSTRATES;

EID: 33748657825     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.06.110     Document Type: Article
Times cited : (8)

References (26)
  • 2
    • 33644897666 scopus 로고    scopus 로고
    • Maeda Y., Homewood K.P., Suemasu T., and Sadoh T. (Eds). Yokohama, Japan, 8-13 October 2003, Elsevier, Amsterdam
    • In: Maeda Y., Homewood K.P., Suemasu T., and Sadoh T. (Eds). Proceedings of Symposium on Semiconducting Silicides: Science and Future Technology of the 8th IUMRS International Conference on Advanced Materials. Yokohama, Japan, 8-13 October 2003. Thin Solid Films vol. 461 no.1 (2004), Elsevier, Amsterdam
    • (2004) Thin Solid Films , vol.461 1
  • 19
    • 33748647089 scopus 로고    scopus 로고
    • ASTM card for X-ray diffraction Data No.71-0088.
  • 21
    • 33748649542 scopus 로고    scopus 로고
    • ASTM cards for X-ray diffraction Data No.72-0307, 87-0897 and 89-2593.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.