메뉴 건너뛰기




Volumn 27, Issue 9, 2006, Pages 749-751

Enhanced band-to-band-tunneling-induced hot-electron injection in p-channel flash by band-gap offset modification

Author keywords

Band to band tunneling induced hot electron (BBHE); High programming speed; Low voltage operation; p channel flash; SiGe

Indexed keywords

BAND STRUCTURE; COMPUTER SIMULATION; ELECTRON DEVICES; SEMICONDUCTOR MATERIALS;

EID: 33748490272     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2006.880642     Document Type: Article
Times cited : (15)

References (15)
  • 2
    • 0033173937 scopus 로고    scopus 로고
    • "SiGe heterostructure CMOS circuits and applications"
    • Aug
    • E. H. C. Parker and T. E. Whall, "SiGe heterostructure CMOS circuits and applications," Solid State Electron, vol. 43, no. 8, pp. 1497-1506, Aug. 1999.
    • (1999) Solid State Electron , vol.43 , Issue.8 , pp. 1497-1506
    • Parker, E.H.C.1    Whall, T.E.2
  • 6
    • 18844402868 scopus 로고    scopus 로고
    • "Enhanced CHISEL programming in flash memory devices with SiGe buried layer"
    • L. M. Weltzer and S. K. Banerjee, "Enhanced CHISEL programming in flash memory devices with SiGe buried layer," in Proc. Non-Volatile Memory Technol. Symp., 2004, pp. 31-33.
    • (2004) Proc. Non-Volatile Memory Technol. Symp. , pp. 31-33
    • Weltzer, L.M.1    Banerjee, S.K.2
  • 7
    • 0003547182 scopus 로고    scopus 로고
    • Avant!, Fremont, CA
    • MEDICI User's Manual, Avant!, Fremont, CA, 2002.
    • (2002) MEDICI User's Manual
  • 9
    • 0021483045 scopus 로고
    • "Lucky-electron model of channel hot-electron injection in MOSFETs"
    • Sep
    • S. Tam, P. Ko, and C. Hu, "Lucky-electron model of channel hot-electron injection in MOSFETs," IEEE Trans. Electron Devices, vol. 31, no. 9, pp. 1116-1125, Sep. 1984.
    • (1984) IEEE Trans. Electron Devices , vol.31 , Issue.9 , pp. 1116-1125
    • Tam, S.1    Ko, P.2    Hu, C.3
  • 10
    • 0026896291 scopus 로고
    • "Design for suppression of gate-induced drain leakage in LDD MOSFETs using a quasi-two-dimensional analytical model"
    • Jul
    • S. A. Parke, J. E. Moon, H. C. Wann, P. K. Ko, and C. Hu, "Design for suppression of gate-induced drain leakage in LDD MOSFETs using a quasi-two-dimensional analytical model," IEEE Trans. Electron Devices, vol. 39, no. 7, pp. 1694-1703, Jul. 1992.
    • (1992) IEEE Trans. Electron Devices , vol.39 , Issue.7 , pp. 1694-1703
    • Parke, S.A.1    Moon, J.E.2    Wann, H.C.3    Ko, P.K.4    Hu, C.5
  • 11
    • 0035445463 scopus 로고    scopus 로고
    • "A comprehensive study of inversion current in MOS tunneling diodes"
    • Sep
    • C.-H. Lin, B.-C. Hsu, M. H. Lee, and C. W. Liu, "A comprehensive study of inversion current in MOS tunneling diodes," IEEE Trans. Electron Devices, vol. 48, no. 9, pp. 2125-2130, Sep. 2001.
    • (2001) IEEE Trans. Electron Devices , vol.48 , Issue.9 , pp. 2125-2130
    • Lin, C.-H.1    Hsu, B.-C.2    Lee, M.H.3    Liu, C.W.4
  • 12
    • 0037766765 scopus 로고    scopus 로고
    • "The effect of dimensional scaling on the erase characteristics of NOR flash memory"
    • Apr
    • W. H. Lee, "The effect of dimensional scaling on the erase characteristics of NOR flash memory," IEEE Electron Device Lett., vol. 24, no. 4, pp. 245-247, Apr. 2003.
    • (2003) IEEE Electron Device Lett. , vol.24 , Issue.4 , pp. 245-247
    • Lee, W.H.1
  • 15
    • 23844459561 scopus 로고    scopus 로고
    • "Mobility-enhancement technologies"
    • May/Jun
    • C. W. Liu, S. Maikap, and C. Y. Yu, "Mobility-enhancement technologies," IEEE Circuits Devices Mag., vol. 21, no. 3, pp. 21-36, May/Jun. 2005.
    • (2005) IEEE Circuits Devices Mag. , vol.21 , Issue.3 , pp. 21-36
    • Liu, C.W.1    Maikap, S.2    Yu, C.Y.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.