Hard x-ray contact microscopy with 250 nm spatial resolution using a LiF film detector and a tabletop microsource

Applied Physics Letters

Volumn 89, Issue 5, 2006, Pages

  Almaviva, S ^a   Bonfigli, F ^a   Franzini, I ^a   Lai, A ^a   Montereali, R M ^a   Pelliccia, D ^b   Cedola, A ^c   Lagomarsino, S ^c  

^a ENEA   (Italy)

^b UNIVERSITÀ DI ROMA LA SAPIENZA   (Italy)

^c CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DETECTORS; FLUORESCENCE; IMAGE ANALYSIS; LITHIUM COMPOUNDS; OPTICAL RESOLVING POWER;

CONFOCAL MICROSCOPES; FRESNEL ZONE PLATE; IMAGING DETECTORS; SPATIAL RESOLUTION;

OPTICAL MICROSCOPY;

EID: 33748464016     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2236283     Document Type: Article

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