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Volumn 76, Issue 11, 2005, Pages 1-12

Soft x-ray submicron imaging detector based on point defects in LiF

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; COLOR CENTERS; CRYSTALS; IMAGING TECHNIQUES; LASER BEAMS; POINT DEFECTS; SAMPLING; X RAY ANALYSIS;

EID: 28444499734     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2130930     Document Type: Review
Times cited : (99)

References (45)
  • 1
    • 28444464050 scopus 로고    scopus 로고
    • See many articles of Special Issue of Rev. Sci. Instrum. 74 (issue III) (2003).
    • (2003) Rev. Sci. Instrum. , vol.74
  • 17
    • 0004233474 scopus 로고
    • edited by J. H.Crawford and L. M.Slifkin (New York
    • E. Sonder and W. A. Sibley, Point Defects in Solids, edited by, J. H. Crawford, and, L. M. Slifkin, (New York, 1972), Chap..
    • (1972) Point Defects in Solids
    • Sonder, E.1    Sibley, W.A.2
  • 20
    • 0011876186 scopus 로고
    • edited by O.Kanert and J. M.Spaeth (World Scientific, Singapore
    • G. Baldacchini, in Defects in Insulating Materials, edited by, O. Kanert, and, J. M. Spaeth, (World Scientific, Singapore, 1993), p. 1103.
    • (1993) Defects in Insulating Materials , pp. 1103
    • Baldacchini, G.1
  • 23
    • 2342580333 scopus 로고    scopus 로고
    • S. Bollanti, Nuovo Cimento D 20D, 1685 (1998); see also: S. Bollanti, Appl. Phys. B, 76, 277 (2003).
    • (1998) Nuovo Cimento D , vol.20 , pp. 1685
    • Bollanti, S.1
  • 24
    • 0038296003 scopus 로고    scopus 로고
    • S. Bollanti, Nuovo Cimento D 20D, 1685 (1998); see also: S. Bollanti, Appl. Phys. B, 76, 277 (2003).
    • (2003) Appl. Phys. B , vol.76 , pp. 277
    • Bollanti, S.1
  • 25
    • 0038732401 scopus 로고    scopus 로고
    • 1063-651X 10.1103/PhysRevE.67.016402
    • K. B. Fournier, Phys. Rev. E 1063-651X 10.1103/PhysRevE.67.016402 67, 016402 (2003); K. B. Fournier, J. Phys. B 35, 3347 (2002).
    • (2003) Phys. Rev. e , vol.67 , pp. 016402
    • Fournier, K.B.1
  • 26
    • 0037077716 scopus 로고    scopus 로고
    • K. B. Fournier, Phys. Rev. E 1063-651X 10.1103/PhysRevE.67.016402 67, 016402 (2003); K. B. Fournier, J. Phys. B 35, 3347 (2002).
    • (2002) J. Phys. B , vol.35 , pp. 3347
    • Fournier, K.B.1
  • 27
    • 0001279871 scopus 로고    scopus 로고
    • edited by H. S.Nalwa (Academic, New York
    • R. M. Montereali, in Handbook of Thin Film Materials, edited by, H. S. Nalwa, (Academic, New York, 2002), Vol. 3, Chap., p. 399.
    • (2002) Handbook of Thin Film Materials , vol.3 , pp. 399
    • Montereali, R.M.1
  • 30
    • 0003143986 scopus 로고
    • edited by W.Beall Folwer (New York and London
    • Physics of Color Centers, edited by, W. Beall Folwer, (New York and London, 1968), Chap., p. 72.
    • (1968) Physics of Color Centers , pp. 72
  • 32
    • 28444444894 scopus 로고    scopus 로고
    • 0277-786X
    • F. Flora, Proc. SPIE 0277-786X 5196, 284 (2004); R. M. Montereali, Proc. SPIE 5451, 393 (2004).
    • (2004) Proc. SPIE , vol.5196 , pp. 284
    • Flora, F.1
  • 33
    • 12344335702 scopus 로고    scopus 로고
    • F. Flora, Proc. SPIE 0277-786X 5196, 284 (2004); R. M. Montereali, Proc. SPIE 5451, 393 (2004).
    • (2004) Proc. SPIE , vol.5451 , pp. 393
    • Montereali, R.M.1
  • 38
    • 28444476213 scopus 로고    scopus 로고
    • Proceedings of the 28th International Conference on Laser Interaction Matter (ECLIM), Rome, Italy, Sept. 6th-10th
    • S. G. Gales and C. D. Benlay, in Proceedings of the 28th International Conference on Laser Interaction Matter (ECLIM), Rome, Italy, Sept. 6th-10th, 2004.
    • (2004)
    • Gales, S.G.1    Benlay, C.D.2
  • 42
    • 0035764699 scopus 로고    scopus 로고
    • Y. Liu, Proc. SPIE 4505, 41 (2001).
    • (2001) Proc. SPIE , vol.4505 , pp. 41
    • Liu, Y.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.