Structure and morphology of the Ni films grown by different deposition methods

Surface and Coatings Technology

Volumn 201, Issue 3-4, 2006, Pages 952-957

  Singh, Surendra ^a   Basu, Saibal ^a  

^a BHABHA ATOMIC RESEARCH CENTRE   (India)

Author keywords

AFM; Interface; Morphology; Thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; CORRELATION METHODS; DEPOSITION; FILM GROWTH; MORPHOLOGY; NICKEL; POLYCRYSTALLINE MATERIALS; SURFACE TOPOGRAPHY; X RAY DIFFRACTION ANALYSIS;

THERMAL EVAPORATION; VISUAL INSPECTION;

THIN FILMS;

ATOMIC FORCE MICROSCOPY; CORRELATION METHODS; DEPOSITION; FILM GROWTH; MORPHOLOGY; NICKEL; POLYCRYSTALLINE MATERIALS; SURFACE TOPOGRAPHY; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EID: 33748428592     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2006.01.017     Document Type: Article

References (23)

1. Han J.H., Yang W.S., Yoo J.B., and Park C.Y. J. Appl. Phys. 88 (2000) 7363
2. Ren Z.F., Huang Z.P., Xu J.W., Wang J.H., Bush P., Siegal M.P., and Provencio P.N. Science 282 (1998) 1105
3. Choi Y.C., Shin Y.M., Lee Y.H., Lee B.S., Park G.S., Choi W.B., Lee N.S., and Kim J.M. Appl. Phys. Lett. 76 (2000) 2367
4. Choi Y.C., Kim D.W., Lee T.J., Lee C.J., and Lee Y.H. Synth. Met. 117 (2001) 81
5. Young Min Shin, et al. J. Cryst. Growth 271 (2004) 81
6. Bochi G., et al. Phys. Rev., B 52 (1995) 7311
7. Ha K., and O'Handley R.C. J. Appl. Phys. 87 (2000) 5944
8. Jungblut R., Johnson M.T., aan de Stegge J., Reinders A., and den Broeder F.J.A. J. Appl. Phys. 75 (1994) 6424
9. Snigirev O.V., et al. Phys. Rev., B 55 (1997) 14429
10. Shen J., Giergiel J., and Kirschner J. Phys. Rev., B 52 (1995) 8454
11. Zheng M., Shen J., Ohresser P., Mohan Ch.V., Klaua M., Barthel J., and Kirschner J. J. Appl. Phys. 85 (1999) 5060
12. Arnault J.C., Knoll A., Smigiel E., and Cornet A. Appl. Surf. Sci. 171 (2001) 189
13. Fang S.J., Haplepete S., Chen W., Helms C.R., and Edwards H. J. Appl. Phys. 82 (1997) 5891
14. Madhav Rao L., Rao K.R., Shukla S.G., and Vyas H.P. Indian J. Pure Appl. Phys. 27 (1989) 601
15. Hope S., et al. Phys. Rev., B 55 (1997) 11422
16. Bennett J.M., and Mattsson L. Introduction to Surface Roughness and Scattering (1989), Optical Society of America, Washington, D.C.
17. Kiely J.D., and Bonnell D.A. J. Vac. Sci. Technol., B 15 4 (1997) 1483
18. Yoshinobu T., Iwamoto A., and Iwasaki H. Jpn. J. Appl. Phys., Part 1 33 (1994) L67
19. Palasantzas G., and Krim J. Phys. Rev. Lett. 73 (1994) 3564
20. Family F. Physica, A 168 (1990) 561
21. Padeletti G., and Larciprete R. J. Vac. Sci. Technol., B 16 3 (1998) 1762
22. Ruppe C., and Duparr A. Thin Solid Films 288 (1996) 8
23. Scharifker B., and Hills G. Electrochim. Acta 28 (1983) 879